1. 学术任职 ·国际学术组织:IEEE 仪器与测量学会无损评估和工业检测技术委员会(TC1-NDE&II)成员(2026-) IEEE荣誉学会 Eta Kappa Nu (HKN) 会员 ·国际学术期刊:副编辑 - IEEE Open Journal of Instrumentation and Measurement(2026-) ·国际学术会议:组委会教程共主席Organizing Committee Tutorial Co-Chairs, IEEE I2MTC 2027 分会共主席Session Co-Chairs, IEEE I2MTC 2022 (I2MTC(国际仪器与测量技术会议)是IEEE 仪器与测量学会的旗舰会议) ·国内学术期刊:首届编委-《电磁功能结构技术》(2025-) 2. 学术获奖 ·紫金青年学者,3044am永利集团3044noc教育基金会2025 ·优秀审稿人Outstanding Reviewer Award,IEEE Transactions on Instrumentation and Measurement 2023 ·最佳学生论文提名Student Best Paper Finalists,IEEE I2MTC 2022 ·最佳学生论文Best Student Paper Award, Annual Meeting and Symposium of the Antenna Measurement Techniques Association (AMTA) 2020 |
[1]C. Liu, M. T. Al Qaseer and R. Zoughi, "Permittivity Extraction from Synthetic Aperture Radar (SAR) Images of Multilayered Media," in IEEE Transactions on Instrumentation and Measurement, vol. 70, pp. 1-11, 2021, Art no. 8004611, doi: 10.1109/TIM.2021.3113118. [2]C. Liu, R. Zoughi, " Adaptive Synthetic Aperture Radar (SAR) Imaging for Optimal Cross-Range Resolution and Image Quality in NDE Applications," in IEEE Transactions on Instrumentation and Measurement, vol. 70, pp. 1-7, 2021, Art no. 8005107, doi: 10.1109/TIM.2021.3118080. [3]C. Liu, M. T. Al Qaseer and R. Zoughi, "Influence of Antenna Pattern on Synthetic Aperture Radar Resolution for NDE Applications," in IEEE Transactions on Instrumentation and Measurement, vol. 70, pp. 1-11, 2021, Art no. 8000911, doi: 10.1109/TIM.2020.3026122. [4] C. Liu and R. Zoughi, "Microwave Harmonic Synthetic Aperture Radar (SAR) Imaging for Detecting Weak-Scattering Defects Exhibiting Nonlinear Behavior," 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), Ottawa, ON, Canada, 2022, pp. 1-5, doi: 10.1109/I2MTC48687.2022.9806665. Student Best Paper Finalists. [5] C. Liu, K. Brinker and R. Zoughi, “Single Antenna Dual Circularly-Polarized Chipless RFID Tag Reading Methodology,” Proceedings of the 42nd Annual Meeting and Symposium of the Antenna Measurement Techniques Association (AMTA), P. 6, November 2-5, 2020 (virtual). Best Student Paper Award.
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